Each instrument in this platform has the capacity to study in situ and in operando phenomena, such as mass deposition, ion (de-)insertion, heterogeneous reactions, and charge transport, that are associated with electrochemical reactions at electrodes. This platform's instruments have the means to accurately track electrochemical processes in a range of device architectures and time scales.
Electrochemical Quartz Microbalance
Electrochemical quartz microbalance with dissipation monitoring and temperature control, BluQCM QSD-300, BioLogic
An EQCM-D, like the BluQCM, is capable to simultaneously monitoring frequency and dissipation. So the variation of the hydrodynamic contribution to the frequency response induced by volume changes of the material during potential cycling on an electrochemical cell is corrected.
An airtight electrochemical cell is available and can be mounted in a glove box. Therefore, in situ measurements under an inert atmosphere are possible and studies to quantify the deposition of material, and characterize ion insertion processes in battery and supercapacitor materials are possible.
Electrochemical Surface Plasmon Resonance
200 Otso, with electrochemical cell
ESPR is critical for investigations of the molecular interactions and processes (i.e., adsorption/absorption, dissolution, desorption, expansion, etc.) that accompany electrochemical reactions at thin solid films. Such equipment is essential for further understanding of reactions at the electrode/electrolyte interface in energy storage devices.
The 200 Otso offers a scanning-angle, two-wavelength SPR instrument equipped with an electrochemical flow-through cell, exactly was being requested for in situ real-time investigations of electrochemical reactions. The instrument’s wide incident angle range permits measurements in organic solvents (refractive indexes up to 1.5). The acquisition of full-angle range SPR curves at two different excitation wavelengths, which is a capability unique to the Navi 200 system, allows the determination of the refractive index and thickness of films ranging from 0.3 nm to a few µm without prior assumptions of the refractive index of the material.
Scanning Electrochemical Microscopy Assisted by AFM
SECM add-on module on Icon AFM, Bruker
A SECM can give spatially resolved electrochemical reactivity data needed for elucidating the mechanistic details of the reactions involved in energy storage and conversion devices. Bruker’s exclusive PeakForce SECM mode is the first complete commercial solution for AFM-based SECM.
With spatial resolution < 100 nm, PeakForce SECM uniquely provides simultaneous capture of topographical, electrochemical, electrical, and mechanical maps, allowing correlations to be made between the different properties. This technology radically redefines what is possible in the nanoscale visualization of electrochemical and chemical processes in liquid. The SECM add-on can be installed on an Icon AFM located in a glove box.
The SECM add-on and the associated Icon AFM are hosted in the Laboratoire de caractérisation des matériaux (LCM) of Université de Montréal. All inquiries should be addressed to Patricia Moraille.
Localized Electrochemical Impedance Spectroscopy System
LEIS measurements are useful when ionic fluxes as well as the spatial mapping of the voltammetric response of electroactive materials are needed. These measurements provide essential and fundamental information on the interrelationships between local electrochemical processes and the device electrical characteristics, thus opening the possibility to finely tune device functionality and performance.
Our LEIS system can yield important information on ionic fluxes in organic and inorganic materials. The scanning vibration probe enable the mapping and quantification of local electrochemical and corrosion events in real time. The SVP370 vibrating probe system provides increased electrical sensitivity as well as enhanced system stability. Localized corrosion events of < 5µA/cm² can be measured with this extremely sensitive technique.
This instrument is located at École Polytechnique. All inquiries about the LEIS should be addressed to Professor Fabio Cicoria.